D8 DISCOVER The Ultimate Thin-Film System
X-Ray Reflectometry (XRR), High-Resolution X-Ray Diffraction (HRXRD), Reciprocal Space Mapping (RSM), Grazing Incidence Diffraction (GID), In-Plane Grazing Incidence Diffraction (IP-GID), Grazing-Incidence Small Angle X-ray Scattering (GISAXS) …, all these complementary techniques allow thorough and non-destructive characterization of thin film samples. Depending on the sample characteristics, different techniques and thus instrument setups are required in order to achieve the best possible data quality in the shortest measurement time. The D8 DISCOVER is the most capable X-ray solution for advanced thin film investigations. Its sophisticated platform design facilitates optimized workflow from instrument setup to results.
Features
Straightforward coplanar and non-coplanar diffraction
Alignment-free switch between configurations
Guaranteed goniometer accuracy and precision
Software-controlled 0°/90° X-ray tube orientation
SNAP-LOCK exchange of primary optics
Push-button switch between diffracted-beam paths
Detector guarantee
Two-dimensional VÅNTEC-500 detector
For a 2-D detector, size is the most important feature. A large detector window not only enables increased data collection speed, it also provides information that is simply not accessible with 0-D, 1-D or smaller 2-D detectors. The VÅNTEC-500 detector features a huge 140 mm diameter window, covering up to about 80° (2θ) and a large γ-range.
SNAP-LOCK X-ray optics for tool-free switching of the diffraction geometry
The factory-aligned, SNAP-LOCK X-ray opticsprovide true ‘plug-and-play’ functionality, including automatic and tool-free switching of the diffraction geometry with minimal user intervention.
An X-ray optics module, a detector, or any accessory mounted onto the instrument registers itself in real-time with its relevant parameters and analytical capabilities, including powerful detection of possible component conflicts.
Fonte - Bruker
24 de marco de 2015
